Session

03.09.2019     12:45–13:45

Title:
Lunchtime lecture
Hitachi High-Technologies Europe GmbH
Type:
Industry session
Room:
The beam sensitive and low contrast nature of some nanomaterials has driven accelerating voltages for TEM/STEM to lower levels, with much work being undertaken at 80kV or lower to mitigate knock-on damage effects. Similarly, as nanostructures and 2D materials become more important, combining surface information with transmitted electron information becomes increasingly critical in order to understand the real-world behavior of materials. This presentation will examine a novel approach where a SU9000 30kV STEM/SEM has been utilized to provide advanced capabilities with EELS and diffraction, heading over newest developments on FIB/SEM to finally cover additional capabilities such as surface imaging available in modern digital TEM with SE technology. On that way we will explain the Hitachi way from 10 to 1 Million eV for Life Science and Material Science research and what products we can provide to fulfill your needs and requirements. Examples will be presented demonstrating contrast improvements, damage reduction and increased analytical signals resulting from low kV, as well as time-to-data and usability advantages of using a dedicated low to high kV TEM/STEM/SEM/FIB.

03.09.2019
12:45–13:45

Title:
Lunchtime lecture
Hitachi High-Technologies Europe GmbH
Type:
Industry session
Room:
The beam sensitive and low contrast nature of some nanomaterials has driven accelerating voltages for TEM/STEM to lower levels, with much work being undertaken at 80kV or lower to mitigate knock-on damage effects. Similarly, as nanostructures and 2D materials become more important, combining surface information with transmitted electron information becomes increasingly critical in order to understand the real-world behavior of materials. This presentation will examine a novel approach where a SU9000 30kV STEM/SEM has been utilized to provide advanced capabilities with EELS and diffraction, heading over newest developments on FIB/SEM to finally cover additional capabilities such as surface imaging available in modern digital TEM with SE technology. On that way we will explain the Hitachi way from 10 to 1 Million eV for Life Science and Material Science research and what products we can provide to fulfill your needs and requirements. Examples will be presented demonstrating contrast improvements, damage reduction and increased analytical signals resulting from low kV, as well as time-to-data and usability advantages of using a dedicated low to high kV TEM/STEM/SEM/FIB.



From 10 to 1.000.000eV – The Hitachi way from SEM to FIB to TEM
Felix von Cube (Krefeld/DE), Jürgen Simon (Krefeld/DE), Thomas Schmidt (Krefeld/DE)